The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 29, 1998
Filed:
Nov. 20, 1996
Applicant:
Inventors:
Felix A Miranda, Olmsted Falls, OH (US);
Stanley S Toncich, San Diego, CA (US);
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324754 ; 3241581 ;
Abstract
A test system is disclosed that enables the testing of microwave components in a controlled environment without disturbing that environment. The system includes a test fixture which holds the calibration standards and the component being tested, and environmental control chamber, and a microwave switching system. The system provides a coaxial connection to microwave testing equipment, such as an automatic network analyzer (ANA) and facilitates both calibration and testing while maintaining environmental integrity.
Quick Actions:
Miranda, Felix. (1998). Method and apparatus for testing microwave devices and circuits in a (U.S. Patent No. 5854559). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5854559
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile