The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 29, 1998
Filed:
Oct. 11, 1996
Lingnan Liu, Mill Creek, WA (US);
Mark Y Shimizu, Seattle, WA (US);
Lisa M Vartanian, Kirkland, WA (US);
Intermec IP Corp., Everett, WA (US);
Abstract
A method and apparatus for reading a distorted image of data collection symbol within a reader image generated and stored by a two-dimensional symbology reader begins by first locating a starting point in the distorted symbol image within the stored reader image. The method identifies edge contours of some or all of the bars and spaces in the symbol. The method then identifies one or more points within each of the identified edges. Thereafter, the method defines one or more sampling paths or lines that extend through the symbol, and through the points such that each line is constructed in a 'connect-the-dot' fashion. The bars and spaces can then be sampled based on one or more of the defined lines, and the information in the symbol decoded from the sampled bars and spaces.