The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 29, 1998
Filed:
Dec. 05, 1996
Gopal Gopinathan, Cary, NC (US);
Edmund F Becker, Lexington, MA (US);
William Wong, Milton, MA (US);
Qiang Xue, Salem, MA (US);
Carl M Good, III, Groton, MA (US);
John Fallon, Andover, MA (US);
Xue-Song Li, Lexington, MA (US);
Analogic Corporation, Peabody, MA (US);
Abstract
A system for assaying a fluid sample for one or more types of analytes, which employs at least one class of finely divided polystyrene spheroidal particles, each class being limited to a predetermined specific narrow range of particle diameters, the particles of each such class being coated with a specific reactant unique for that class. After the coated particles are mixed with the sample to specifically react to form conjugates of the particles and any of the analyte present, the mixture is irradiated with bursts of ultrasound swept over a range of frequencies resonant to the expected conjugate sizes. The presence of the conjugates and therefore the analyte is detected directly by measuring any selective absorption or scattering of waves of frequencies to which the conjugates are resonant.