The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 22, 1998
Filed:
Apr. 04, 1997
Douglas C Youvan, San Jose, CA (US);
Mary M Yang, San Jose, CA (US);
KAIROS Scientific Inc., Santa Clara, CA (US);
Abstract
An optical instrument for use in collecting light from an object, the optical instrument having a post-objective waist with a variable optical filter positioned approximately at the post-objective waist. The invention also comprises an optical instrument for collecting light from an object, comprising an objective lens positioned to receive light from the object, an exit lens positioned to focus the light at a focal position, and a variable optical filter positioned between the objective lens and the focal position approximately at a waist of the light. The optical instrument may be an epifluorescence microscope for use in observing an image formed from light from an object under illumination by a light source. The light source may be, for example, a filtered light source or a monochromatic light source, preferably in an epifluorescence configuration. The variable optical filter may be a circular variable interference filter or a tilting interference filter. In some embodiments, the orientation of the filter may be varied to block light outside of one band at one time and outside of another band at another time. The variable filter preferably is band pass, blocking substantially all light at wavelengths other than a selected wavelength band.