The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 22, 1998

Filed:

Apr. 28, 1997
Applicant:
Inventors:

Chih-Hsun Chu, Hsinchu, TW;

Ching-Nan Yang, Hsinchu Hsien, TW;

Assignee:

Mosel Vitelic Inc., Hsinchu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L / ;
U.S. Cl.
CPC ...
438434 ; 438224 ; 438561 ; 438563 ;
Abstract

A new method for forming shallow trench isolation is disclosed herein. A pad oxide layer and a silicon nitride layer are formed on a wafer, respectively. A plurality of trenches are created in the wafer. Then, a SAC layer is formed on an N-well. A BSG layer is formed on a P-well and the N-well. A thermal process is used to form a channel stop in the P-well. Then, the BSG layer and the SAC layer are removed. Subsequently, a LPD oxide layer is deposited in the trenches. Then, a CMP process is used to polish the LPD oxide layer for planarization. The pad oxide layer and the silicon nitride layer are removed. Next, a gate oxide layer is formed on the wafer.


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