The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 15, 1998
Filed:
Nov. 15, 1994
Applicant:
Inventors:
Shogo Matsui, Kawasaki, JP;
Kenichi Kobayashi, Kawasaki, JP;
Assignee:
Fujitsu Limited, Kawasaki, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K / ;
U.S. Cl.
CPC ...
382145 ;
Abstract
An image data inspecting method detects whether or not a pattern described by a first image data and a pattern described by a second image data match. This method includes the steps of (a) carrying out a sizing process on the first and second image data so that the patterns described thereby are at least enlarged or reduced by the same amount, and (b) comparing the first and second image data which are processed in the step (a) to determine whether or not the processed first and second image data match.
Matsui, Shogo. (1998). Image data inspecting method and apparatus providing for equal sizing of (U.S. Patent No. 5850467). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5850467
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