The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 15, 1998
Filed:
Aug. 28, 1991
Kazuo Shimura, Kanagawa-ken, JP;
Yuuma Adachi, Kanagawa-ken, JP;
Shoji Hara, Kanagawa-ken, JP;
Nobuyoshi Nakajima, Kanagawa-ken, JP;
Wataru Ito, Kanagawa-ken, JP;
Fuji Photo Film Co., Ltd., Kanagawa, JP;
Abstract
An abnormal pattern detecting apparatus comprises a device for finding prospective abnormal patterns in a radiation image of an object from an image signal representing the radiation image, and a device for finding anatomical information about the object from the image signal. From the image signal components of the image signal, which represent the image information at positions in the vicinity of each prospective abnormal pattern, a characteristic measure calculating device calculates a plurality of characteristic measures for each prospective abnormal pattern. An abnormal pattern finding device utilizes the characteristic measures and the anatomical information in order to find a true abnormal pattern from the prospective abnormal patterns.