The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 15, 1998
Filed:
Feb. 11, 1997
Applicant:
Inventors:
Bradley J Stringer, Farmington, UT (US);
Michael K Elwood, Salt Lake City, UT (US);
Assignee:
Quantronix, Inc., Farmington, UT (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S / ;
U.S. Cl.
CPC ...
367128 ; 702159 ;
Abstract
A method and apparatus for measuring the dimensions and determining the three-dimensional, spatial volume of objects, particularly small objects. Reflected laser light sensors are employed. A stationary measurement embodiment of the apparatus may be employed to measure regular cuboidal objects. A dynamic or in-motion embodiment may be employed to measure the dimensions of cuboidal objects or a three-dimensional outline of objects of irregular configuration.