The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 15, 1998
Filed:
Oct. 31, 1996
Philip M Giles, Bethlehem, PA (US);
Other;
Abstract
A method for analyzing a data set and determining the independent input variables and the values of those variables which are most associated with a specific outcome. Independent and dependent variables may be either numeric (continuous) or categoric (discrete); numeric variables need not be of a specific distribution type. First, each individual independent variable is ranked based on a score. Scoring is done by first determining the number of records in the data set having each of four possible conditions--independent variable in or out of range in combination with dependent variable in or out of range. These values are put into an equation. Iterative processes are used until a high score is found. Subsequently, combinations of variables and values of independent variables are evaluated using the score to determine the combinations most likely to be associated with a specific outcome or range of values of the dependent variable. A use for this method is the determination of manufacturing variables and their values which tend to result in unacceptable product.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile