The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 15, 1998
Filed:
Feb. 11, 1997
Applicant:
Inventors:
Assignee:
Carl-Zeiss-Stiftung, Heidenheim, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B / ; G01B / ;
U.S. Cl.
CPC ...
33503 ; 33556 ; 33DI / ;
Abstract
The invention is directed to a coordinate measuring apparatus wherein the drives (3, 5, 6) for the measuring sleds of the apparatus are controlled on circularly-shaped paths to machine-control adjust the spatial orientation of the probe pin 9. The probe pin is attached to a passive rotation-pivot joint and has a probe ball which is driven into one of several centering gaps of a body 10. In this way, a separate drive for the rotation-pivot joint 8 is not needed.
Quick Actions:
Wiedmann, Wolfgang. (1998). Coordinate measuring apparatus having a spatially adjustable probe pin (U.S. Patent No. 5848477). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5848477
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile