The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 08, 1998

Filed:

Aug. 06, 1996
Applicant:
Inventors:

Yoh-Han Pao, Cleveland Heights, OH (US);

Pui-Chiu Yip, Euclid, OH (US);

Assignee:

AI Ware, Inc., Beachwood, OH (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
706 13 ; 706 14 ;
Abstract

A parallel, distributed processing system is provided for solving NP-hard problems, and the like, efficiently, quickly and accurately. The system employs parallel processors which are iteratively and intelligently allocated for a series of generations of child solutions from selected, previous generation or parent solutions. The system employs multiple levels of competition for generating a next level of possible solutions and for reallocating processor resources to the most promising regions for finding a best solution to the task. This includes both inter-family competition, as well as intra-family competition. System temperature data are set and gradually decreased with each succeeding generation. A degree of randomness is entered into the solution generation. The hierarchical and iterative process, incorporating randomness and a decreasing temperature provides for the guided evolutionary simulated annealing solution generation.


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