The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 08, 1998
Filed:
Aug. 15, 1996
Sony Corportion, Tokyo, JP;
Sony Trans Com, Inc., Irvine, CA (US);
Abstract
A boundary scan analog signal test circuit for boundary scan testing of analog signals. The boundary scan analog signal test circuit provides for known upper and lower bound values at specified times for testing whether sample analog signals are within the specified lower and upper bound values. If the sample analog signals are not between the known upper and lower bound values, the boundary scan analog signal test circuit produces a result flag indicating a 'not pass' for the device being tested. If the sample analog signal being tested is found to be within the known upper and lower bound values, then the circuit generates a result flag indicating that the device being tested has passed the test.