The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 08, 1998
Filed:
Aug. 02, 1995
Roland Marbot, Versailles, FR;
Jean-Claude Le Bihan, Montrouge, FR;
Andrew Cofler, Paris, FR;
Anne Pierre Duplessix, Paris, FR;
Pascal Couteaux, Ecouen, FR;
Reza Nezamzadeh-Moosavi, Bois d'Arcy, FR;
Bull S.A., Puteaux, FR;
Abstract
A process and apparatus for sampling a serial digital signal (D), which includes phasing of the digital signal with a clock signal (C) and sampling the digital signal at delayed instants (Si), wherein the phasing is carried out in reference to the sampling instants. The phasing includes determining phasing test instants (Pi) which refer to the sampling instants (Si) to verify whether transitions of the digital signal are leading or lagging in phase relative to the phasing test instants. The determination of the phasing test instants is achieved by adding to each sampling instant (Si) a delay Y=kR/2, in which k is a positive whole odd number other than zero and R designates a pulse repetition period of the bits of the digital signal (D). The invention has particular utility in data processing and remote data processing systems, and to telecommunication systems.