The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 08, 1998
Filed:
Dec. 24, 1996
Applicant:
Inventors:
Kunihiro Katayama, Nara, JP;
Tadashi Yoshikawa, Nara, JP;
Assignee:
Sharp Kabushiki Kaisha, Osaka, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
371 2231 ; 371 2236 ;
Abstract
A test device which employs a scan path method includes a latch circuit for holding a scan in signal, a transfer gate connected between the scan in signal and an input terminal of the latch circuit and having a gate terminal receiving a clock signal, a select circuit for selecting one of a data signal and an output signal from the latch circuit in response to a mode select signal and for outputting the selected signal, and a flipflop circuit for holding an output signal from the select circuit in response to the clock signal and for outputting the held signal as a scan out signal.