The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 08, 1998
Filed:
Aug. 08, 1996
Tatsuro Otaki, Tokyo, JP;
Nikon Corporation, Tokyo, JP;
Abstract
A microscope apparatus having an objective optical system for condensing a beam emitted from a sample to form an intermediate image; a lens-barrel optical system for focusing a beam from the intermediate image to form an observation image; and an eyepiece optical system for enlarging and projecting a beam from the observation image; wherein the lens-barrel optical system includes a relay lens system for focusing a beam from the intermediate image formed by the objective optical system to form the observation image and guiding a beam from the observation image to the eyepiece optical system; and a beam rotating unit having a plurality of reflecting members three-dimensionally arranged in an optical path between the objective optical system and the observation image, wherein the plurality of reflecting members successively reflect the beam from the objective optical system to invert the beam about an optical axis of the relay lens system, thereby forming the observation image in the form of an inverted image. This arrangement permits the lens-barrel optical system to form the inverted observation image as focusing the beam from the inverted intermediate image in the compact, easy, and cheap structure.