The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 08, 1998
Filed:
May. 08, 1997
Applicant:
Inventors:
James P Fulton, Clifton Park, NY (US);
Min Namkung, Yorktown, VA (US);
John W Simpson, Tabb, VA (US);
Russell A Wincheski, Williamsburg, VA (US);
Shridhar C Nath, Ames, IA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B / ; G01R / ;
U.S. Cl.
CPC ...
324229 ; 324202 ; 324230 ; 324240 ; 324241 ;
Abstract
A thickness gauging instrument uses a flux focusing eddy current probe and two-point nonlinear calibration algorithm. The instrument is small and portable due to the simple interpretation and operational characteristics of the probe. A nonlinear interpolation scheme incorporated into the instrument enables a user to make highly accurate thickness measurements over a fairly wide calibration range from a single side of nonferromagnetic conductive metals. The instrument is very easy to use and can be calibrated quickly.