The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 01, 1998
Filed:
Jul. 29, 1996
Nobuhiro Morita, Yokohama, JP;
Masayuki Takai, Sagamihara, JP;
Ricoh Co., Ltd., , JP;
Abstract
Accurate yet cost-effective measurement methods and systems determine eccentricity at a particular location of the aspherical lens surface. Since an aspherical lens generally has varying degrees of curvature along the aspherical surface, the eccentricity at the selected location on the aspherical lens surface provides precise information in determining the quality of a certain type of an aspherical lens component. Furthermore, these improved methods and systems according to the current invention are applicable to measure eccentricity of a selected aspherical lens surface in a complex lens assembly containing a plurality of aspherical lens components.