The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 01, 1998
Filed:
Apr. 08, 1997
Leon F Strenkoski, Dexter, MI (US);
Maureen A Schneider, Farmington Hills, MI (US);
Shoba C Swamy, Canton, MI (US);
Mandar S Nagar, Yosilanti Township, MI (US);
Difco Laboratories, Inc., Ann Arbor, MI (US);
Abstract
A rapid screening method for the detection and identification of target microorganisms in a sample which may contain both target microorganisms and competing non-target microorganisms includes the steps of enriching a sample in a mildly selective medium, incubating the sample in the growth medium for a predetermined amount of time, adding at least one inhibitor of the non-target microorganisms to the growth medium to discourage the growth of non-target microorganisms and to encourage the growth of target microorganisms. The method further includes the steps of incubating the sample in the growth medium including at least one inhibitor for a predetermined amount of time, performing biochemical assays specific for the identification of the target microorganisms, and detecting the presence of the target microorganisms in the sample. The invention further provides a system for the rapid detection of microorganisms in a sample.