The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 01, 1998
Filed:
Nov. 02, 1995
Applicant:
Inventors:
Sudhir Dattatraya Savkar, Schenectady, NY (US);
Robert David Lillquist, Niskayuna, NY (US);
Russell Scott Miller, Ballston Spa, NY (US);
Assignee:
General Electric Company, Schenectady, NY (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
C23C / ; G01B / ;
U.S. Cl.
CPC ...
115712 ; 1187 / ; 118730 ;
Abstract
This invention relates to novel apparatuses for measuring deposit thickness during composite materials production. More particularly, this invention uses a composite's emission signature or a composite's reflectance signature, to measure deposit thickness.
Savkar, Sudhir. (1998). Measuring deposit thickness in composite materials production (U.S. Patent No. 5843232). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5843232
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile