The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 24, 1998

Filed:

Nov. 25, 1994
Applicant:
Inventors:

Masayoshi Naito, Kawagoe, JP;

Naoki Tanaka, Tokyo, JP;

Hiroshi Okamoto, Ome, JP;

Masahiro Kayama, Hitachi, JP;

Yasuo Morooka, Hitachi, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
395 10 ; 395 11 ;
Abstract

A chaotic character evaluating apparatus includes a processor for predicting future variation in sequential data and a processing for determining a degree of accuracy of the prediction, a processor for predicting variation of the sequential data in reverse and a processor for determining a degree of accuracy of the prediction, and a processing for comparing the degrees of accuracy with each other. If the degrees of the accuracy differ from each other, the variation of the sequential data is determined to be attributable to chaos, while when the degrees of accuracy are substantially equal to each other, the variation in the sequential data is determined to be attributable to noise. Further, a control apparatus for generating a control value from a feedback signal output from an object under control and having chaotic components eliminated is realized. Thus, it is possible to easily and accurately determine whether variation in the sequential data is attributable to chaos or noise.


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