The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 24, 1998

Filed:

Nov. 01, 1996
Applicant:
Inventors:

Neil G Jacobson, Mountain View, CA (US);

Derek R Curd, San Jose, CA (US);

Assignee:

Xilinx, Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L / ;
U.S. Cl.
CPC ...
380 25 ; 380-4 ; 326 39 ;
Abstract

The present invention provides an efficient programming verification system for Programmable Logic Devices (PLDs). Based upon IEEE JTAG standard boundary scan test architecture, the invention provides a novel test architecture including a configuration register and a signature analyzer coupled between the TDI and TDO pins of the JTAG architecture. The configuration register of the invention comprises three parts: an address register/counter, a data register, a status register. The address register/counter performs dual functions depending upon an instruction received by an instruction register. The invention eliminates the need to load each address sequentially into the address register/counter for programming by enabling the address register/counter to auto-increment the address for memory locations. After loading an initial address value, the address register/counter automatically increments the address for programming memory cells. To verify PLD programming, the invention applies a signature analyzer coupled between the TDI and TDO pins. A single input linear feedback shift register (SISR) or multiple LFSR (MISR) can be used to implement a signature analyzer in accordance with the invention. SISR or MISR uses a characteristic polynomial to generate a near-unique signature checksum for an input sequence. The accumulated signature checksum is then provided serially through the TDO pin for inspection.


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