The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 24, 1998
Filed:
Mar. 31, 1997
Applicant:
Inventors:
Richard Aufrichtig, Wauwatosa, WI (US);
Alexander Y Tokman, Waukeshe, WI (US);
Assignee:
General Electric Company, Milwaukee, WI (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01D / ;
U.S. Cl.
CPC ...
378207 ; 378204 ;
Abstract
An image quality test phantom tool is provided for use in the calibration and standardization of digital x-ray fluoroscopy and radiography systems. A composite phantom has a base for providing mechanical stability, a mesh with a central cut-out overlaid on the base, inserts positioned in the cut-out, and a carrier for housing the composite phantom. A digital image of the phantom is processed to compute x-ray system image quality measurements.
Aufrichtig, Richard. (1998). Apparatus and method for automatic monitoring and assessment of image (U.S. Patent No. 5841835). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5841835
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile