The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 24, 1998

Filed:

Sep. 24, 1996
Applicant:
Inventors:

Kayoko Kawano, Kawasaki, JP;

Yasushi Takaki, Kawasaki, JP;

Assignee:

Fujitsu Limited, Kawasaki, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
371 225 ; 38518306 ;
Abstract

In a processing system having a testing mechanism for implementing a test on a high density packaging printed circuit board, a data storing unit has an object chip component set unit in which information as to at least one object chip component is set in order to designate the object chip component, a data storage for object chip component for holding therein data that should be written into a register of the object chip component, and a data control unit for writing data held in the data storage for object chip component into the register of the object chip component set in the object chip component set unit in a shifting operation, whereby predetermined data may be written in a register in the testing mechanism without causing an increase of the number of registers for setting data or a storage region used to set data therein so as to simplify a system structure or improve an efficiency of a data setting process.


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