The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 24, 1998
Filed:
Aug. 07, 1997
Applicant:
Inventors:
Assignee:
Matsushita Electric Industrial Co., Ltd., Osaka-fu, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ; G01B / ; G01D / ; G01N / ;
U.S. Cl.
CPC ...
356376 ; 356381 ; 250230 ; 25055919 ; 25055927 ; 25055906 ;
Abstract
The three-dimensional measuring apparatus of the present invention includes an optical beam scanning unit for scanning a projected-and-depressed surface of an object with an optical beam while controlling the scanning operation, and a detector unit for receiving a reflected optical beam reflected by the projected-and-depressed surface through the scanning operation and for thereby measuring height information on the projections and depressions of the object, in which noise information due to noise generated during the control of the scanning operation with the optical beam is prevented from being transmitted as the height information from the detector unit.