The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 24, 1998

Filed:

Oct. 23, 1996
Applicant:
Inventors:

Henry M D'Souza, Cypress, TX (US);

Edwin J Sarver, Merritt Island, FL (US);

Youssef S Wakil, Houston, TX (US);

Assignee:

Eyesys Technologies, Inc., Irvine, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
351212 ; 351247 ;
Abstract

A method for analysis of the curvature of the surface of a cornea using a checkered placido comprises, projecting the image of the checkered placido onto a patient's cornea, detecting the image of the checkered placido reflected off of the cornea, detecting a plurality of nodal points from the reflected image, determining the mean curvature at a plurality of nodal points and analyzing the mean curvature at a plurality of nodal points in order to produce a graphic display of the estimated actual curvature of the cornea.


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