The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 24, 1998
Filed:
Aug. 01, 1996
Gary Sedman Chisholm, Christchurch, NZ;
Jason Scott Daly, Christchurch, NZ;
Michael Anthony Hansby, Christchurch, NZ;
Trimble Navigation Limited, Sunnyvale, CA (US);
Abstract
Determination of the verticality of various structures such as high rise buildings and towers is enabled through various methods involving use of a series of tiltmeter devices, a remote positioning system, or a combination of both. These methods are particularly useful in monitoring deviations from vertical during construction work and adjusting a jumpform. The tiltmeters are typically arranged in a line on the structure and polled to characterise varying tilt states in which displacement of each device increases with height up the structure. The remote positioning measurements are typically made in real time using a satellite based system such as GPS. Departures of a survey point on the jumpform from a vertical target line may be used to monitor verticality during the construction process. These methods may be combined, with tiltmeter measurements being used to monitor growth of a tower structure and calculate an expected position of the jumpform at each stage of construction, and GPS measurements being used to monitor the actual position.