The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 24, 1998

Filed:

Oct. 31, 1996
Applicant:
Inventors:

Terumi Takashi, Ebina, JP;

Kazunori Iwabuchi, Yokohama, JP;

Minoru Kosuge, Odawara, JP;

Hiromi Matsushige, Odawara, JP;

Hideki Miyasaka, Odawara, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03L / ;
U.S. Cl.
CPC ...
327156 ; 327160 ; 327162 ;
Abstract

Count pulses CTP from a counter 15 are supplied to a phase detector 3 through a two-frequency-divider 17 to produce measurement data N.sub.1 representing a difference in phase from a synchronized peak pulses PK. In a subtractor 4, the measurement data N.sub.1 is compensated with error data Ne from a register 13 in order to reduce the number of steady-state phase errors. An internal phase error .DELTA.N produced by the subtractor 4 is supplied to an LPF 5, undergoing compensation processing in a digital filter 7 thereof. The LPF 5 also includes a phase compensator 6 and a period compensator for compensating a control delay experience by the internal phase error .DELTA.N in the digital filter 7. An integer part OPD1 of counter oscillation period data OPD output by the LPF 5 is used for determining an oscillation period of a counter 15 whereas a fraction part OPD2 thereof is accumulated in a register 12 through an adder 11. An error accumulated in a register 12 is transferred to a register 13 and stored therein as error data Ne. Accordingly, the acquisition time is shortened and the number of steady-state errors is also reduced as well.


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