The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 24, 1998
Filed:
Jan. 24, 1997
Applicant:
Inventor:
Mark E Froggatt, Yorktown, VA (US);
Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
73597 ; 73609 ; 73610 ;
Abstract
A measuring apparatus uses a variable and fixed frequency pulsed phase locked loop to measure the phase shift caused by a delay path to a high degree of accuracy. This accurate measurement of total phase change through greater than 360 degrees allows the apparatus to measure strain in bolts or other materials. The apparatus is able to identify features on a waveform through pattern recognition, and measure untracked phase differences with better reliability than simple thresholding techniques permit.