The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 24, 1998
Filed:
May. 21, 1997
Applicant:
Inventor:
J H Chung, Rockwall, TX (US);
Assignee:
E-Systems, Inc., Dallas, TX (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ; G01N / ;
U.S. Cl.
CPC ...
73583 ; 73578 ; 73600 ; 364508 ;
Abstract
A method and apparatus for evaluation and inspection of a composite-repaired structure generates a frequency-varying electrical signal to test and evaluate the composite-repaired area. The electrical signal is converted into a mechanical signal and transmitted through the composite-repaired area of the structure. The transmitted mechanical signal is received and converted into an electrical signal for processing. The processed signal is compared with a baseline reference signal to determine whether the composite-repaired area is damaged or undamaged. The baseline reference signal is obtained at the time of the composite repair of the structure.