The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 17, 1998
Filed:
Dec. 20, 1996
Henry C Kancler, Los Altos Hills, CA (US);
James D Roberts, San Jose, CA (US);
Lockheed Martin Corp., Sunnyvale, CA (US);
Abstract
A dithered image reconstruction system and method that compensates for inter-detector errors in a manner that does not adversely affect detection of small-amplitude images in the presence of a very bright large-amplitude background. An overlapping dither pattern is employed in a detector array (103), and outputs generated by individual detectors (302) are adjusted in an iterative fashion to hold all outputs for a particular detector substantially constant, while allowing each set of outputs for each image section to converge on a solution. The system and method do not substantially distort the received signal, nor do they fail when the image characteristics have little spatial variation, such as when a large target area is being detected.