The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 17, 1998
Filed:
Oct. 31, 1996
Michael Inbar, Santa Barbara, CA (US);
Phase Metrics, Inc., San Diego, CA (US);
Abstract
The present invention relates to a method and apparatus for the measurement of defects in magnetic recording disks using a logarithmic amplifier. A magnetic head senses a magnetic field of a magnetic disk and creates a read signal having a varying amplitude. The test apparatus has a squarer which receives and squares the read signal. A logarithmic amplifier coupled to the squarer converts the squared signal to a logarithmic signal. The logarithmic signal is filtered by a first filter. A second filter coupled to the logarithmic amplifier provides an average of the peaks of the logarithmic signal. A digital-to-analog converter coupled to the second filter scales the output of the second filter. The test apparatus further comprises a comparator having a first input and a second input, where the first input is coupled to the first filter, and the second input is coupled to the digital-to-analog converter. The comparator provides an output signal in response to receiving a signal from the first filter having an amplitude that is lower than an average of a predetermined number of peak values of the signal, thereby indicating an error in the disk. In another embodiment, the test apparatus is implemented using a rectifier instead of a squarer.