The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 17, 1998
Filed:
Jan. 17, 1997
Robert E Peale, Oviedo, FL (US);
Henry Weidner, Orlando, FL (US);
University of Central Florida, Orlando, FL (US);
Abstract
A low cost method of adding time-resolving capability to commercial Fourier-transform spectrometers with a continuously scanning Michelson interferometer. This invention is specifically designed to eliminate noise and artifacts caused by mirror-speed variations in the interferometer. The method exists as two parts: 1) a novel timing scheme for synchronizing the transient events under study with the digitizing by an analog-to-digital converter, and 2) a mathematical algorithm for extracting the spectral information from the recorded data. The novel timing scheme is a modification of the well known interleaved, or stroboscopic, method. It achieves the same timing accuracy, signal-to-noise ratio, and freedom from artifacts as step-scan time-resolving Fourier spectrometers by locking the sampling of the interferogram to a stable time base rather than to the occurrences of the HeNe fringes. The necessary path-length-difference information at which samples are taken is obtained from a record of the mirror speed. The resulting interferograms with uneven path-length-difference spacings are transformed into optical frequency space by least-squares fits of periodic functions.