The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 17, 1998

Filed:

Sep. 13, 1996
Applicant:
Inventors:

Robert L Dickerman, Northfield, MA (US);

Marc A Camerlin, Westfield, MA (US);

Stanley Klein, Cromwell, CT (US);

Michel St Martin, Springfield, MA (US);

David S Leonard, Feeding Hills, MA (US);

Assignee:

Combustion Enginineering, Inc., Windsor, CT (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
73610 ; 73625 ; 73628 ; 73611 ; 73612 ; 364508 ; 364550 ;
Abstract

An ultrasonic testing system can receive data from at least two ultrasonic transducers and process the data in parallel to each other. The testing system can compress the data by a fixed ratio by storing the value of the sample having the highest-amplitude out of a group of samples. The testing system can also provide threshold-based run-length encoding by compressing data by only storing samples which exceed a user-defined threshold value as well as a user-defined range of samples surrounding said samples. The ultrasonic testing system also provides a hardware gate for storing a peak amplitude and associated time-of-flight for a user-defined interval and a gate for storing the time-of-flight for the first excursion of the data through a user-defined threshold and interval. The operation of these gates or the storage of waveform data may be delayed by a constant delay or until the data exceeds a user-selectable threshold during a user-selectable time interval. The system also provides a multi-channel design allowing simultaneous waveform and/or hardware gate acquisition of data on more than one channel and permitting the parallel processing of data.


Find Patent Forward Citations

Dickerman, Robert. (1998). Ultrasonic testing (ut) system having improved signal processing (U.S. Patent No. 5837899). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5837899

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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