The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 17, 1998
Filed:
Aug. 08, 1996
Applicant:
Inventors:
Yutaka Tsuchiya, Hamamatsu, JP;
Yutaka Yamashita, Hamamatsu, JP;
Assignee:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
600476 ; 356 39 ;
Abstract
Apparatus for measuring characteristics of a scattering medium. A light source irradiates the medium to be measured with a plurality of measurement light beams. A wavelength selector unit selectively extracts diffused light having a particular wavelength. A photodetector unit measures a time response characteristic of the diffused light. The signal processing system drives the light source so as to sequentially cause measurement light beams to be incident on the scattering medium and controls a measurement action of the photodetector unit while analyzing the time-response characteristics so as to calculate the internal information in the scattering medium.