The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 10, 1998
Filed:
Apr. 28, 1997
Hermann Scheil, Hemhofen, DE;
Siemens Aktiengesellschaft, Munich, DE;
Abstract
A method for analyzing or conditioning a measurement value identified in a system process of a measurement system and a measurement value analyzer for carrying out the method, test the measurement value for plausibility at a first comparison point with reference to characteristic variables specific to the measurement system. In order to achieve a particularly high degree of reliability when monitoring the measurement value for errors, the consistency of the measurement value with measurement parameters identified independently of the measurement value, is tested at a second comparison point with reference to rules characteristic of the system process. A confidence factor for the measurement value is identified in dependence on a result of the testing.