The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 10, 1998

Filed:

Nov. 21, 1996
Applicant:
Inventor:

Barbara L Farrell, Ontario, NY (US);

Assignee:

Xerox Corporation, Stamford, CT (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K / ; G06K / ;
U.S. Cl.
CPC ...
382168 ; 382172 ;
Abstract

A method and system generates a histogram from a scanned image by creating a sample window defined by a number of scanlines to be sampled, a number of leading scanlines to be skipped in a slowscan direction before sampling, a number of leading pixels to skip in a fastscan direction before sampling begins, and a number of pixels within a scantine to be sampled. It is then determined if a number of pixels in the sample window is greater than a capacity of a histogram buffer. If it is determined that the number of pixels in the sample window is greater than the capacity of the histogram buffer subsample windows are created within the sample window. The image is scanned and a predetermined number of pixels within each subsample window is processed to generate a histogram, the predetermined number being less than a total number of pixels in a subsample window if it is determined that the number of pixels in the sample window is greater than the capacity of the histogram buffer, thereby processing a total number of pixels that is less than or equal to the capacity of the histogram buffer.


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