The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 10, 1998
Filed:
Sep. 15, 1992
Gaston A Vandermeerssche, Milwaukee, WI (US);
Stephen M Dicke, Evanston, IL (US);
Other;
Abstract
A specimen to be tested for resistance to abrasion is optically scanned prior to abrasion to produce a first array of pixels. The specimen then is abraded under controlled conditions and scanned again after abrasion to produce a second array of pixels. The sections of the two arrays which relate to the specimen are registered to each other. Corresponding pixels for the specimen in each array are compared to produce plurality of values indicating the difference between the pixels. The difference values are used to quantify the abrasion in various defined regions of the specimen. The quantifying employs the difference values to determine an average magnitude, a mean square energy, and an average voltage of the abrasion. A contour map of the specimen is displayed to graphically show the degree of abrasion in the regions.