The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 10, 1998
Filed:
Mar. 04, 1996
Applicant:
Inventors:
Kamal Dalmia, Vancouver, CA;
Andre Ivanov, Richmond, CA;
Brian Donald Gerson, Coquitlam, CA;
Curtis Lapadat, Burnaby, CA;
Assignee:
PMC-Sierra Ltd., Burnaby, CA;
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
371-51 ; 371-1 ; 371 61 ;
Abstract
A jitter test system for a clock and data recovery unit (CRU) is comprised of a data generating apparatus, apparatus for clocking the data generating apparatus with a jittered clock, apparatus for applying a stream of data generated by the data generating apparatus that has been jittered by the jittered clock to an input of the CRU, and apparatus for detecting a bit error rate of a data signal output from the CRU.