The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 10, 1998
Filed:
Sep. 13, 1996
Raul Curbelo, Lexington, MA (US);
Bio-Rad Laboratories, Inc., Hercules, CA (US);
Abstract
For a step-scanning Fourier transform spectrometer comprising an interferometer, a detector, and a digital signal processor (DSP), a method for measuring a response of a sample to multiple modulations is disclosed. In one embodiment, the method comprises the steps of utilizing the DSP to measure a phase modulation angle and a sample modulation angle; obtain an interferogram that corresponds to a calibrated static sample response by using the measured phase modulation rotation angle; obtain another interferogram which corresponds to the calibrated dynamic sample response by using both the measured phase and sample modulation rotation angles; and computing one or more spectra from the interferograms which indicates the calibrated response of said sample to the multiple modulations.