The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 10, 1998

Filed:

Feb. 09, 1996
Applicant:
Inventors:

Shimon Eckhouse, Haifa, IL;

Michael Kreindel, Haifa, IL;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
600476 ; 2504612 ;
Abstract

A method and apparatus for determining skin lesion parameters comprise directing light to the skin in which the lesion is located and monitoring the reflection of that light. Then, the spatial and spectral distribution of the reflected light is analyzed. The depth is determined by finding a location where the difference between a spectral intensity of reflected light and an average reflected intensity is greater than a maximal difference between the intensity of each point and an average intensity for normal skin. The wavelength of the light reflected from the location is determined, and from the wavelength the penetration depth is determined. The penetration depth is also the depth of the lesion below the skin surface. The size is determined by determining a plurality of locations where the deviation between the spectral intensity and the average intensity is greater than the maximal deviation for normal skin. Based on the spatial distribution of the locations the size of the lesion is determined.


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