The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 03, 1998

Filed:

Jun. 26, 1992
Applicant:
Inventors:

John G Harris, Watertown, MA (US);

Bimal P Mathur, Thousand Oaks, CA (US);

Shih-Chii Liu, Woodland Hills, CA (US);

Assignee:

Rockwell International Corporation, Costa Mesa, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K / ;
U.S. Cl.
CPC ...
382223 ; 382254 ; 348241 ;
Abstract

A nonlinear resistive network, which includes switches in the data paths, is provided for identifying, isolating, and/or rejecting outliers in a sensor image. During normal operation, images are received with all the switches in a closed (conducting) state. If the data at a given pixel is different from its immediate neighbors by a predetermined threshold voltage, its switch is opened. A readout of the state of all the switches in the network yields a map of points sources, and a readout of the network voltages yields a noise-free image. Because the threshold voltage can be controlled externally, various strategies may be implemented for identification of the outliers in a computer vision system.


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