The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 03, 1998

Filed:

Aug. 16, 1995
Applicant:
Inventors:

Maryellen L Giger, Elmhurst, IL (US);

Kunio Doi, Willowbrook, IL (US);

Ping Lu, Chicago, IL (US);

Zhimin Huo, Chicago, IL (US);

Assignee:

Arch Development Corporation, Chicago, IL (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K / ;
U.S. Cl.
CPC ...
382130 ; 382132 ;
Abstract

A method and system for the automated detection and classification of masses in mammograms. These method and system include the performance of iterative, multi-level gray level thresholding, followed by a lesion extraction and feature extraction techniques for classifying true masses from false-positive masses and malignant masses from benign masses. The method and system provide improvements in the detection of masses include multi-gray-level thresholding of the processed images to increase sensitivity and accurate region growing and feature analysis to increase specificity. Novel improvements in the classification of masses include a cumulative edge gradient orientation histogram analysis relative to the radial angle of the pixels in question; i.e., either around the margin of the mass or within or around the mass in question. The classification of the mass leads to a likelihood of malignancy.


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