The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 03, 1998

Filed:

Oct. 23, 1995
Applicant:
Inventors:

Philip E Brown, Westfield, NJ (US);

Pramod Warty, Freehold, NJ (US);

Assignee:

Lucent Technologies Inc., Murray Hill, NJ (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
371 271 ; 364580 ;
Abstract

The testing of a series of commands is enhanced using a multilevel approach that employs orthogonal arrays within orthogonal arrays. Specifically, an Orthogonal Array (OA) is applied within each operation and then re-applied across the different operations. Thus, the process initially applies an OA to an intra-operation covering the different combinations of command parameters associated with an operation. The process applies an OA to an inter-operations OA covering the combinations of all command parameters.


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