The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 03, 1998

Filed:

Dec. 13, 1996
Applicant:
Inventors:

Brian C Miller, Fort Collins, CO (US);

Alan S Krech, Jr, Fort Collins, CO (US);

Assignee:

Hewlett-Packard Co., Palo Alto, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
371 221 ;
Abstract

Apparatus for electrically verifying a functional unit contained within an integrated circuit comprises a functional unit, a state machine, a number of integrated circuit input pins, and means for alternately providing the functional unit with control data derived from the state machine, and control data derived from the number of integrated circuit input pins. The means for providing control data from alternating sources comprises a multiplexor which receives a first set of inputs from the state machine, and a second set of inputs from a test control block. The test control block monitors various of the integrated circuit input pins for a designated instruction, receives control data via the input pins, and controls the operation of the multiplexor. The test control block comprises a number of test registers which can be configured to receive two or more states of control data. An additional multiplexor, internal to the test control block, may then be used to sequentially provide successive states of 'test' control data to the functional unit.


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