The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 03, 1998
Filed:
Jun. 24, 1996
Applicant:
Inventors:
Sandeep A Aji, San Francisco, CA (US);
Meera Kasinathan, Sunnyvale, CA (US);
Assignee:
Sun Microsystems, Inc., Palo Alto, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
364489 ; 364488 ; 364490 ; 364491 ;
Abstract
An automated method and system for detecting electromigration violations in signal lines of an integrated circuit design to be fabricated is disclosed. The automated method and system checks conductive traces, vias and/or contacts that are used to route signals to and from various functional cells within the integrated circuit design against predetermined process rules to detect electromigration violations. The operation and effectiveness of the automated method and system are far superior to conventional manual approaches.