The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 03, 1998

Filed:

Jan. 17, 1996
Applicant:
Inventors:

Norihito Yamamoto, Shiga, JP;

Koichi Tanaka, Kyoto, JP;

Atsushi Hisano, Kyoto, JP;

Assignee:

Omron Corporation, Kyoto, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
36446801 ; 39518322 ;
Abstract

A method and device for supporting the repair of defective portions of a substrate when the defective portions have been discovered during an inspection process. A recorder records defective data associated with the defective portions. A data sorter sorts the defective data by grouping together defective data relating to a same type of defect. A data indicator highlights a defective location on the substrate where the defective portions were found in an order determined by defective data relating to the same type of defect or in an order determined by defective data relating to defects requiring the same type of repair. The data indicator also indicates the type of repair required and the tools to be used in the repair of the defective portions.


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