The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 03, 1998
Filed:
Feb. 24, 1997
Katherine L Hall, Westford, MA (US);
Kristin A Rauschenbach, Lexington, MA (US);
Massachusetts Institute of Technology, Cambridge, MA (US);
Abstract
An optical bit error tester for testing an optical device. The optical bit error tester, in one embodiment, includes an optical bit pattern generator, an optical beam divider in communication with the optical bit pattern generator, the optical device being tested and an optical XOR gate. The optical XOR gate in one embodiment includes a first input port in communication with the beam divider and a second input port in communication with the optical device being tested. The optical XOR gate produces an output signal at its output port in response to changes introduced by the optical device under test in the optical bit pattern produced by the optical bit pattern generator. In one embodiment the optical XOR gate includes a non-linear optical loop mirror.