The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 03, 1998

Filed:

Apr. 02, 1997
Applicant:
Inventors:

Fumio Kubota, Nishinomiya, JP;

Hideo Kusuzawa, Kobe, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
356 73 ; 356 23 ;
Abstract

A particle analyzer includes a sheath flow cell for converting a particle containing sample into a sample flow, a first light source for illuminating the sample flow by a continuous light, a light detecting element for detecting a light emitted from a particle illuminated by the first light source and for converting the light into a particle signal indicative of a characteristic of the particle, a second light source for illuminating the sample flow by a momentary light, an imaging device for capturing an image of a particle illuminated by the second light source, an analyzing section for performing particle analysis by employing the particle signal and the image of the particle as analysis data for analyzing the particle, and an inhibiting section for inhibiting the analyzing section from employing, as the analysis data, the particle signal obtained when the second light source illuminates the sample flow.


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