The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 03, 1998
Filed:
Mar. 28, 1996
Applicant:
Inventors:
Assignee:
Kabushiki Kaisha TEC, Shizuola, JP;
Primary Examiner:
Int. Cl.
CPC ...
B41J / ; B41J / ;
U.S. Cl.
CPC ...
347171 ;
Abstract
A deviation test pattern includes a reference scale printed by one reference printing unit among a plurality of printing units arranged to print overlaid images of yellow, magenta, cyan and black. The reference scale has a plurality of scale bars arranged in a main-scanning direction at a pitch of 30 dots. Particularly, the deviation test pattern further includes a difference scale printed adjacent to and in parallel to the reference scale by a printing unit other than the reference printing unit. The difference scale has a plurality of scale bars arranged in the main-scanning direction at a pitch of 29 dots (or 31 dots).