The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 03, 1998
Filed:
Jan. 05, 1996
Applicant:
Inventors:
Rajesh Ramadoss, Piscataway, NJ (US);
Michael L Bushnell, East Windsor, NJ (US);
Assignee:
Rutgers University, Piscataway, NJ (US);
Primary Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324537 ; 324500 ; 364553 ; 364578 ;
Abstract
The present invention relates to a method and apparatus for generating test patterns to test an analog or mixed signal circuit. A signal flow graph of the analog circuit is determined. The signal flow graph is inverted and reverse simulated with good and bad outputs to determine component tolerances of the circuit given circuit output tolerances. The inverted signal flow graph is backtraced from analog outputs to obtain analog input sinusoids which justify the analog outputs.